Print

Print


Dear Laurent,

interesting indeed, I will read it. 

In addition to what you suggest, recent mappings between the two standards would be interesting too, also in the context of specific projects.

Kind regards,

Øyvind

> Am 19.03.2018 um 15:57 schrieb Laurent Romary <[log in to unmask]>:
> 
> Dear Øyvind,
> We have recently issued a paper which has been accepted for Archival Science: https://hal.inria.fr/hal-01737568 <https://hal.inria.fr/hal-01737568>
> where we describe how we use ODD for EAD customization. I don’t know it is what you had in mind.
> 
> An interesting topic where I would like to hear more feedback is bootstrapping TEI content my means of EAD input…
> 
> Laurent
> 
> 
>> Le 19 mars 2018 à 15:49, Øyvind Eide <[log in to unmask] <mailto:[log in to unmask]>> a écrit :
>> 
>> Dear all,
>> 
>> Does anybody know about recent work into integrating/interconnecting TEI with EAD? I know of the stuff more than ten years ago but TEI has evolved (and I would assume EAD is not exactly the same either) so: anything more recent?
>> 
>> Kind regards,
>> 
>> Øyvind
> 
> Laurent Romary
> Inria, team ALMAnaCH
> [log in to unmask] <mailto:[log in to unmask]>
> 
> 
> 
> 
> 
>